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5.4 ESS Implementation:
ESS is product-specific, since each product has its own set of potential
defects, and since the applied ESS stresses affect each product differently.
Eventhough the ESS process must be set up separately for each product, there are
many common features of both products and stresses which cause many ESS
processes to be similar.
The stresses applied in ESS are those which are expected to precipitate
manufacturing defects. They are not necessarily those which the product will see
in service. The two most common ESS stresses for electronic products are
temperature cycling and vibration. They may be applied sequentially or
simultaneously. ESS may be conducted anywhere in the manufacturing process flow.
5.4.1 Types of Failures detectable by Thermal and
Vibration environments:
| Parameter |
Thermal |
Vibration |
| Wrong component |
Yes |
- |
| Parameter drift |
Yes |
- |
| Defective Solder Joint |
Yes |
Yes |
| Loose hardware |
- |
Yes |
| Broken(partially)
component/ lead |
Yes |
Yes |
| Improper Crimp |
Yes |
Yes |
| Chafed or pinched wires |
- |
Yes |
Normally, 100% of a group of
product is subjected to environmental stimulus
for a pre determined time for the purpose of forcing failure to occur in-house.
ESS on a sampling basis is worthwhile if the design and production methods are
mature and stable. In practice it was observed that about 80% of the failures
are sensitive to atmospheric tests and about 20% to vibration. Temperature and
Humidity tests are effective for defect types like wire insulation, improper
crimp or mating, parametric drift, corrosion, and hermetic sealed failures.
Vibration is more effective for the defects like loose contacts, debris, Chafed
& pinched wire and adjacent boards/parts shorting.
5.4.2 Differences in the screening of components
and equipment:
|
Components |
Equipment |
| 1. Operating environment |
In general, precise
operating environment is not known. It is likely to be used in different
conditions and variety of equipment in which it is used. |
In general, the operating
environment of equipment is known at the time of manufacture. |
| 2. Test Procedure |
Highly standardized test
procedures are necessary so that results on different samples of the same
type taken either from different suppliers or at different times from the
same supplier are comparable. |
2. It is less commonly
necessary to compare the results between similar equipment from different
sources of supply. |
| 3. Severity of environment |
Components are usually
tested to more severe levels than equipment in order to ascertain their
performance limits. |
For equipment, the
severity level is determined by the weakest link ( by design) and is
generally less severe. |
| 4. Sample size |
Components are frequently
available in sufficient quantities to permit simultaneous tests to be
applied to several lots. |
Few equipment are
available for test and each specimen undergoes the entire test programme.
For complex equipment, the tests can be involved and costly. |
5.4.3 Design of screens, important points:
* Screen parameters are independent of field environment
* Screen parameters are set subject to equipment design capability.
* Applied stress must reach
flaw location
* Overstress must be avoided. Overstress can be detected by unnatural
failure modes.
* Factors which determine level of assembly to perform screening,
-Cost
- Effectiveness of the screen to expose failures
* Screening programmes must be reviewed dynamically.
1. Thermal screen design:
* Determine the initial ESS test conditions which is characterized by the
following parameters:
- Cycle characteristics
-Low temperature
-High temperature
- Rate of change of temperature
- Dwell times at temperature extreme
-No of cycles
-Equipment Condition
-Powered ON or Powered OFF
-Monitored or NOT monitored
* Analyze failures that occur
** If no failures, increase initial test conditions
** For all failures that occur, perform failure analysis and corrective
action. If no failures occur, initial test conditions can be increased in steps
such that the screening is effective. If failure was caused by overstress,
decrease the severity of test conditions. Failures occurring due to Overstress
is a subject of Engineering judgement and experience.
* Continue modifying thermal stress until only ‘latent defects’ are
disclosed.
2. Vibration screen design:
* Begin with initial g rms level (e.g. 6 grms)
- Vibration step-stress is increased in one g rms increments
- Functional testing of unit during vibration is required
* Failure modes are noted at each vibration level
* Rigorous failure analysis and corrective action is essential
* Vibration level in g rms is increased until non-defect failure modes
occur. This represents the design capability
* Further review of screen is essential on accumulated data.
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